Temptronic Corporation  






Product Index


Used Equipment

Site Map


Temptronic Corporation

Semiconductor Overview
 - ThermoStream�
 - ThermoChamber
 - ThermoChuck�
 - Benchtop Testing

 - Data Sheets/Application Notes



Environmental Test Overview
 - MobileTemp

 - ThermoStream

 - ThermoChamber�

 - Thermal Systems

 - Thermal Chambers

 - Data Sheets/Application Notes

Contact Temptronic

Worldwide Technical Support

Quality Management System


  inTEST Company Overview  
  InTEST Manipulator and Docking Hardware  
  inTEST Test Interfaces  


� 2005-2013 inTEST Corp.

All rights reserved. Privacy/Legal.



Thermal Shock  -   Fast Temperature Cycle  -  Thermal Stress Screening  -  Test Chamber Fixtures
Temperature Characterization - Product Development - Temperature Testing 


Temptronic Corporation, the pioneer and worldwide leader in localized thermal inducing systems, in 1970 introduced the concept of providing accurate, controlled "Temperature On the Spot" at the test site as a convenient alternative to temperature chambers and baths.

Bringing precise temperature to the test site for wafers, components, hybrids, printed circuit boards and other devices enables the user to incorporate temperature into any test equipment for characterizing, qualifying and performing fault isolation on a component, PCB, module or wafer for MilSpec, design or production testing.

With more than 40 years of expertise interfacing to the major ATE equipment and wafer probing systems, Temptronic's thermal inducing systems and accessories are an accurate and convenient solution. Whether thermal testing and cycling components, wafers, printed circuit boards, arrays, modules, MCMs, wafers, hybrids and ICs at precisely controlled temperatures at the tester site or on the wafer probing station. Temperatures range from -100 degrees to +300 degrees C. All systems are CFC-free and most systems are available compliant with the European CE standards.

ISO 9001:2015 Certified

Semiconductor Test  



  Temptronic Corporation