ThermoChuck®
THERMAL INDUCING PLATFORM

Perform wafer probing, testing and failure analysis at precise temperature at the wafer probing station.

Test wafers up to 300mm diameter from -65° to +400°C.

Temperature/Wafer-Diameter Graphs

The tables below can assist you in selecting a ThermoChuck System by:
  • Wafer/ThermoChuck diameter
  • Temperature Range
  • ThermoChuck Model Number


 

 
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